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Design and Fabrication of a Silicon Interposer With TSVs in Cavities for Three-Dimensional IC Packaging

机译:带有腔体的TSV硅中介层的设计和制造,用于三维IC封装

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Flip chip is one of the packaging techniques for high-performance components. There is a greater demand on integrating more functions in a smaller chip nowadays. This leads to the increase of I/O density. Organic substrate is the bottleneck of the high-density packaging. A silicon interposer with through-silicon vias (TSVs) is commonly used to provide a platform with a high wiring density to redistribute I/Os. After I/O redistribution, larger solder joints with a larger pitch can be used to connect the interposer to the organic substrate. In this paper, a TSV-based silicon interposer with a cavity and copper pillars for 3-D packaging is presented. The cavity hosts the flip-chip device. There are copper-filled TSVs in the cavity to provide the electrical interconnections to the backside of the interposer. Flip-chip solder bumps are electroplated on the copper pillars. Subsequent to the flip-chip assembly process, the device is seated in the cavity entirely. The backside of the flip chip is lower than that of the surface of the interposer. This provides a better environment for further die stacking on the surface of the interposer. The microfabrication process of the proposed silicon interposer with TSVs in cavities is discussed in detail.
机译:倒装芯片是高性能组件的封装技术之一。如今,在较小的芯片中集成更多功能的需求越来越大。这导致I / O密度的增加。有机基材是高密度包装的瓶颈。具有直通硅通孔(TSV)的硅中介层通常用于提供具有高布线密度的平台以重新分配I / O。 I / O重新分配后,可以使用具有较大间距的较大焊点将插入器连接到有机基板。在本文中,提出了一种基于TSV的硅中介层,该中介层具有用于3-D封装的空腔和铜柱。空腔容纳倒装芯片器件。空腔中有填充铜的TSV,以提供与内插器背面的电气互连。倒装芯片焊料凸块电镀在铜柱上。倒装芯片组装过程之后,该器件将完全置于腔中。倒装芯片的背面低于中介层表面的背面。这为在转接板的表面上进一步进行裸片堆叠提供了更好的环境。详细讨论了所提出的在腔中具有TSV的硅中介层的微细加工工艺。

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