机译:4H-SiC N / P沟道MOSFET的移动性分析高达300°C
Chinese Acad Sci Inst Microelect Beijing 100029 Peoples R China|Univ Chinese Acad Sci Sch Microelect Beijing 100049 Peoples R China;
Chinese Acad Sci Inst Microelect Beijing 100029 Peoples R China;
Zhuzhou CRRC Times Semicond Co Ltd State Key Lab Adv Power Semicond Device Zhuzhou 412001 Peoples R China;
Chinese Acad Sci Inst Microelect Beijing 100029 Peoples R China;
Chinese Acad Sci Inst Microelect Beijing 100029 Peoples R China|Univ Chinese Acad Sci Sch Microelect Beijing 100049 Peoples R China;
Chinese Acad Sci Inst Microelect Beijing 100029 Peoples R China;
Chinese Acad Sci Inst Microelect Beijing 100029 Peoples R China;
Chinese Acad Sci Inst Microelect Beijing 100029 Peoples R China;
Chinese Acad Sci Inst Microelect Beijing 100029 Peoples R China;
Chinese Acad Sci Inst Microelect Beijing 100029 Peoples R China;
Chinese Acad Sci Inst Microelect Beijing 100029 Peoples R China;
Acceptor/donor traps; high temperature; low-field mobility; scattering mobility; silicon carbide MOSFETs;
机译:通过高温N 2退火改善4H-SiC MOSFET中的N和P沟道迁移率
机译:使用薄SiO 2 sub> / Al 2 sub> O 3 sub>栅堆叠的高迁移率增强模式4H-SiC MOSFET的设计和分析
机译:4H-SiC NMOS电容器和横向MOSFET的界面陷阱密度和沟道迁移率分析
机译:钝化处理对P沟道4H-SIC MOSFET通道移动性的影响
机译:4H-SIC沟槽MOSFET:实用的表面沟道迁移率提取
机译:4H-SIC双沟MOSFET采用分流异质结闸用于改善开关特性
机译:具有外延沟道结构的4H-siC p沟道mOsFET
机译:具有高迁移率的常闭4H-siC沟槽栅极mOsFET(预印刷)