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Extension of high density interconnect multichip module technology for MEMS packaging

机译:用于MEMS包装的高密度互连多芯片模块技术的推广

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In this paper, we describe research into extending the General Electric (GE) Chip-on-Flex (COF) process for packaging microelectromechanical systems (MEMS). COF is a derivative of the high density interconnect (HDI) used for multichip module packaging of microelectronics. COF is a high performance, low cost multichip packaging technology in which die are encased in a molded plastic substrate and interconnects are made via a thin-film structure formed over the components. For MEMS packaging, the standard COF process has been modified to include laser ablating windows in the interconnect overlay to allow access to MEMS. Special purpose surface and bulk micromachining test die were developed and packaged with CMOS electronics using the COF process. The COF/MEMS packaging technology is well-suited for applications in which monolithic integration of MEMS and electronics is not optimal.
机译:在本文中,我们描述了在延伸通用电气(GE)芯片上弯曲(COF)工艺的研究,用于包装微机电系统(MEMS)。 COF是用于微电子的多芯片模块包装的高密度互连(HDI)的衍生物。 COF是一种高性能,低成本多芯片封装技术,其中管芯被包装在模制的塑料基板中,并且通过在部件上形成的薄膜结构进行互连。对于MEMS封装,已经修改了标准COF处理,以包括互连覆盖层中的激光烧蚀窗口以允许访问MEMS。使用COF工艺通过CMOS电子产品开发和散装特殊用途表面和散装微机械测试模具。 COF / MEMS包装技术非常适合MEMS和电子产品的单片集成而不是最佳的应用。

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