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The effect of underfill on the pressure cooker test performance of flip chip on board assembly

机译:底部填充对倒装板上组装压力锅测试性能的影响

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The use of polymer underfill in Flip chip on Board (FCOB) assembly can significantly enhance assembly reliability performance compared to un-underfilled assembly in the temperature cycling test. This is achieved by reducing the strain on solder joints caused by thermal mismatch of silicon chip and organic substrate. Although reliability performance of FCOB assembly in accelerated testing environment, such as thermal shock and temperature cycling, has been widely reported, the reliability performance data in Pressure Cooker Test (PCT) is not widespread. This paper addresses the above issue. Several types of underfill from different sources were used in FCOB assembly and PCT was performed. FCOB assembly without underfill was also tested for reference. It was found that underfill can either enhance, be compatible with, or deterirate the PCT performance as compared to that of un-underfilled FCOB assembly. It was also found that the adhesion of underfill to organic passivation material on the chip has a significant impact on PCT performance.
机译:与温度循环测试中未未填充的组件相比,在板上倒装芯片(FCOB)组件中使用聚合物底部填充可以显着提高组件的可靠性。这是通过减少由硅芯片和有机基板的热失配引起的焊点应变来实现的。尽管已经广泛报道了FCOB组件在加速测试环境(例如热冲击和温度循环)中的可靠性能,但压力锅测试(PCT)中的可靠性能数据并不广泛。本文解决了上述问题。 FCOB组装中使用了几种来自不同来源的底部填充胶,并进行了PCT。没有底部填充的FCOB组件也经过测试以供参考。已经发现,与未填充FCOB组件相比,填充不足可以增强,兼容或破坏PCT性能。还发现,底部填充材料对芯片上的有机钝化材料的粘附性对PCT性能有重大影响。

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