首页> 外文会议>2011 12th International Conference on Electronic Packaging Technology High Density Packaging >Influence of nano-TiO2 reinforcements on the wettability and interfacial reactions of novel lead-free Sn3.5AgO.5Zn composite solder/Cu solder joints
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Influence of nano-TiO2 reinforcements on the wettability and interfacial reactions of novel lead-free Sn3.5AgO.5Zn composite solder/Cu solder joints

机译:纳米TiO 2 增强剂对新型无铅Sn3.5AgO.5Zn复合焊料/ Cu焊料接头的润湿性和界面反应的影响

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The influences of intermixing nano-Ti02 particles on the wettability and interfacial reaction of novel lead-free Sn3.5Ago.5Zn composite solder with Cu substrate were investigated. The wettability of the Sn3.5Ag0.5Zn composite solder alloy was measured by the sessile-drop method under a 10−3 Torr vacuum at different temperature up to 30 mins. Scanning electron microscopy (SEM) was used to quantify the interfacial microstructure for each processing condition. The continuous scallop-type Cu6Sn5 IMC layer was still the only original product at the SAZ solder/Cu and SAZ composite solder/Cu interface at temperature 300 °C. However, a new flat-type QisZrig IMC layer was formed at the Cu6Sn5/Cu interface at temperature 325 °C. The addition of nano-Tio2 particles to the SAZ solder effectively improved in wetting property and corresponding suppressed the growth of the IMC layer at the interface.
机译:研究了纳米TiO 2 混合粒子对新型无铅Sn3.5Ago.5Zn复合焊料与Cu基底的润湿性和界面反应的影响。采用固滴法在10 sup -3 s Torr真空下,在长达30分钟的不同温度下,对Sn3.5Ag0.5Zn复合焊料合金的润湿性进行了测量。扫描电子显微镜(SEM)用于量化每种加工条件的界面微观结构。连续扇贝型Cu 6 Sn 5 IMC层仍然是温度为300°C时SAZ焊料/ Cu和SAZ复合焊料/ Cu界面上唯一的原始产品。然而,在325°C的Cu 6 Sn 5 / Cu界面上形成了一个新的扁平型QisZrig IMC层。向SAZ焊料中添加纳米Tio 2 颗粒可有效改善润湿性,并相应地抑制了界面处IMC层的生长。

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