Study on detection method of small-size solder ball defects

摘要

In order to solve defect detection problem of small-size solder ball in the high density chip, the method based on the pulsed eddy current thermal imaging technology (ECPT) was put forward to study the solder ball defects. With establishing 3D induction heating finite element model, the defects such as cracks, voids can be distinguished by comparing the different temperature field. Furthermore, the experiments with solder balls of different defects and various crack size are carried out. Both experiment result and simulation study verify the reliability and convenience of ECPT method.