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Methods of Manufacturing Semiconductor Devices Including Gate Patterns with Sidewall Spacers

机译:包括具有侧壁间隔物的栅极图案的半导体器件的制造方法

摘要

A method of forming a semiconductor device includes forming a gate electrode on a substrate, forming a first spacer on a sidewall of the gate electrode, forming a second spacer on the first spacer, and forming a capping pattern on top surfaces of the gate electrode, the first spacer and the second spacer. An outer sidewall of the second spacer is vertically aligned with a sidewall of the capping pattern.
机译:一种形成半导体器件的方法,包括:在基板上形成栅电极;在栅电极的侧壁上形成第一间隔物;在第一间隔物上形成第二间隔物;以及在栅电极的顶面上形成覆盖图案;第一间隔物和第二间隔物。第二间隔物的外侧壁与盖图案的侧壁垂直对准。

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