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Surface Micromachined Combined Magnetometer/Accelerometer for Above-IC Integration

机译:用于IC以上集成的表面微机械组合式磁力计/加速度计

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摘要

This paper presents a combined magnetometer/accelerometer sharing a single surface micromachined structure. The device utilizes electrical current switching between two perpendicular directions on the structure to achieve a 2-D in-plane magnetic field measurement based on the Lorentz force. The device can concurrently serve as a 1-D accelerometer for out-of-plane acceleration, when the current is switched off. Accordingly, the proposed design is capable of separating magnetic and inertial force measurements, achieving higher accuracy through a single compact device. The sensor supports static operation at atmospheric pressure, precluding the need for complex vacuum packaging. It can alternatively operate at resonance under vacuum for enhanced sensitivity. The device is fabricated using a low-temperature surface micromachining technology, which is fully adapted for above-IC integration on standard CMOS substrates. The resonance frequency of one of the fabricated structures is measured to be 6.53 kHz with a quality factor of ~30 at a 10-mTorr ambient vacuum level. The magnetic field and acceleration sensitivities of the device are measured using discrete electronics to be 1.57 pF/T and 1.02 fF/g, respectively, under static operation.
机译:本文提出了一种组合式磁力计/加速度计,共享一个单表面微机械结构。该设备利用结构上两个垂直方向之间的电流切换来实现基于洛伦兹力的二维平面内磁场测量。当电流关闭时,该设备可以同时用作一维加速度计,用于平面外加速度。因此,提出的设计能够分离磁力和惯性力测量值,并通过单个紧凑型设备实现更高的精度。该传感器支持大气压下的静态操作,无需复杂的真空包装。它也可以在真空下共振下工作,以提高灵敏度。该器件采用低温表面微加工技术制造,该技术完全适合于在标准CMOS基板上进行IC以上集成。在10 mTorr的环境真空度下,所制造结构之一的共振频率测得为6.53 kHz,品质因数约为30。在静态操作下,使用分立电子设备测得的设备的磁场和加速度敏感度分别为1.57 pF / T和1.02 fF / g。

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