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Selective UV radiation detection on the basis of low-dimensional ZnCdS/ZnMgS/GaP and ZnCdS/ZnS/GaP heterostructures

机译:基于低维ZnCdS / ZnMgS / GaP和ZnCdS / ZnS / GaP异质结构的选择性UV辐射检测

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摘要

The detecting properties of periodic heterostructures with ZnCdS quantum wells separated by ZnMgS or ZnS barrier layers are studied. Heterostructures are grown on semi-insulating GaP substrates by metal organic vapor-phase epitaxy (MOVPE). On their basis, metal-semiconductor-metal (MSM) diodes with interdigital Schottky contacts 3 mu m, distances between them of 3 mu m, and a total detector area of 100 x 100 mu m are fabricated. The detectors have low dark currents (10(-12) A); at low bias voltages, they provide a narrow- band response (full-width at half-maximum of FWHM = 18 nm at a wavelength of 350 nm) which is controlled by the ZnCdS quantum-well composition. As bias is increased to 70 V, the maximum detector sensitivity shifts by a wavelength of 450 nm, which is caused by penetration of the external-bias electric field into the semi-insulating GaP substrate. In this case, the narrow-band response of the detector at a wavelength of 350 nm is retained, i.e., the two-color detection of light is provided.
机译:研究了用ZnMgS或ZnS势垒层隔开的ZnCdS量子阱对周期性异质结构的检测特性。异质结构通过金属有机气相外延(MOVPE)在半绝缘GaP衬底上生长。在此基础上,制造了具有叉指形肖特基触点3微米,它们之间的距离为3微米,探测器总面积为100 x 100微米的金属-半导体-金属(MSM)二极管。探测器的暗电流低(10(-12)A);在低偏置电压下,它们提供了一个窄带响应(在350 nm波长处,FWHM的一半最大值处的全宽度= 18 nm),该响应由ZnCdS量子阱组成控制。当偏置电压增加到70 V时,最大检测器灵敏度会移动450 nm的波长,这是由于外部偏置电场渗透到半绝缘GaP基板中引起的。在这种情况下,保留了检测器在350nm波长处的窄带响应,即,提供了光的双色检测。

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