The paper presents new, CMOS compatible temperature sensors designed for the built-in thermal testing of VLSI circuits. The sensors have been tested by five realizations. Statistical analysis of the measured sensor parameters and the experimental and theoretical investigations in a broad ( - 72.5 to + 165℃) temperature range are presented. The second part of the paper deals with the application. Experimental results, for example interfacing the sensor with the boundary-scan (BS) test circuitry, on-line thermal monitoring, measuring thermal transients by accessing the sensor via the BS interface, etc., demonstrate the wide usability of the sensor. # 1998 Elsevier Science S. A. Allrights reserved.
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机译:本文提出了一种新的,兼容CMOS的温度传感器,专门用于VLSI电路的内置热测试。传感器已通过五种实现方式进行了测试。给出了在较宽的温度范围(-72.5至+ 165℃)内对所测传感器参数的统计分析以及实验和理论研究。本文的第二部分介绍了该应用程序。实验结果,例如将传感器与边界扫描(BS)测试电路接口,在线热监测,通过BS接口访问传感器来测量热瞬变等,证明了传感器的广泛用途。 #1998 Elsevier Science S. A.保留所有权利。
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