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Peculiarities of formation and annealing of VO-related defects in Ge doped with tin

机译:GE掺杂锡型益型缺陷的形成与退火的特性

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The effect of tin on the formation and temperature transformation of VO centers in Ge upon annealing has been investigated. It was found that the doping of Ge with tin leads to a change of reactions involving oxygen and vacancies and the new defect SnVO appears upon VO annealing. Doping Ge with tin gives rise to a considerable decrease in the formation efficiency of divacancies and VO centers and the latter exist in a very narrow temperatures range. VO_2 complexes appear only upon annealing of SnVO centers. The assumption is made that the absorption bands situated at 718.9 and 733.6 cm~(-1) belong to the less stable configuration VO_2* and the bands at 731.5 and 771.7 cm~(-1) correspond to stable configuration of VO_2 centers.
机译:研究了锡对退火时GE vo中心的形成和温度变换的影响。 结果发现,用锡掺杂Ge导致涉及氧气和空位的反应的变化,并且在vo退火时出现新的缺陷snvo。 用锡掺杂GE产生了显着的分布和VO中心的形成效率的显着降低,后者存在于非常窄的温度范围内。 vo_2复合物仅出现在SNVO中心的退火时。 假设位于718.9和733.6cm〜(-1)处的吸收带属于稳定的配置VO_2 *,731.5和771.7cm〜(-1)的条带对应于VO_2中心的稳定配置。

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