首页> 外文期刊>Reliability Engineering & System Safety >SEU emulation in industrial SoCs combining microprocessor and FPGA
【24h】

SEU emulation in industrial SoCs combining microprocessor and FPGA

机译:结合了微处理器和FPGA的工业SoC中的SEU仿真

获取原文
获取原文并翻译 | 示例
           

摘要

FPGAs (Field-Programmable Gate Array) and FPGA-based SoCs (System-on-chip) are electronic devices which offer high computational performance and low time-to-market for low and medium production volumes. They are gaining popularity in critical sectors, such as automotive, aerospace, avionics and railway, making their reliability evaluation mandatory. FPGAs are notoriously sensitive to SEUs (Single Event Upsets), which are random memory errors provoked by radiation particles. The failure rate of an FPGA varies with the implemented design, depending on the amount of used resources and the implemented redundancy schemes among others. FPGAbased circuits are being used in complex safety-critical engineering systems that are designed in compliance with dependability regulations. This work presents an emulation-based methodology for estimating the failure rate of designs implemented in FPGA SoCs, which is a key data in this scenario. (C) 2017 Elsevier Ltd. All rights reserved.
机译:FPGA(现场可编程门阵列)和基于FPGA的SoC(片上系统)是电子设备,可为中小批量生产提供高计算性能和较短的上市时间。它们在汽车,航空航天,航空电子和铁路等关键领域越来越受欢迎,因此必须进行可靠性评估。 FPGA对SEU(单事件翻转)非常敏感,SEU是辐射粒子引起的随机存储器错误。 FPGA的故障率随实施的设计而变化,具体取决于使用的资源量和实施的冗余方案。基于FPGA的电路已用于复杂的安全关键工程系统中,这些系统的设计符合可靠性法规。这项工作提出了一种基于仿真的方法,用于估计在FPGA SoC中实现的设计的失效率,这是该场景下的关键数据。 (C)2017 Elsevier Ltd.保留所有权利。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号