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Observing hot carrier distribution in an n-type epitaxial graphene on a SiC substrate

机译:观察SiC衬底上n型外延石墨烯中的热载流子分布

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Hot carrier dynamics in the Dirac band of n-type epitaxial graphene on a SiC substrate were traced in real time using femtosecond-time-resolved photoemission spectroscopy. The spectral evolution directly reflects the energetically linear density of states superimposed with a Fermi–Dirac distribution. The relaxation time is governed by the internal energy dissipation of electron–electron scattering, and the observed electronic temperature indicates cascade carrier multiplication.
机译:使用飞秒时间分辨光发射光谱法实时跟踪了SiC衬底上n型外延石墨烯的Dirac带中的热载流子动力学。频谱演化直接反映了与费米-狄拉克分布叠加的状态的能量线性密度。弛豫时间由电子-电子散射的内部能量耗散决定,观察到的电子温度表明级联载流子倍增。

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