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A novel bi-directional high voltage PMOS with trench gate structure (Waveform Depletion MOS: WDMOS) for 65V HVICs

机译:具有沟槽栅极结构的新型双向高压PMO(波形耗尽MOS:WDMOS),适用于65V HVICS

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摘要

In this paper, we propose a new bi-directional high voltage PMOSFET that improves a back-gate bias effect due to WDMOS (Waveform Depletion MOS) structure. In WDMOS structure, plural trench gates are adjacent each other. Therefore, the silicon between trench gates is easily depleted and a back-gate bias effect can be suppressed. We present excellent characteristics of the bi-directional high voltage PMOSFET with WDMOS structure.
机译:在本文中,我们提出了一种新的双向高压PMOSFET,其由于WDMOS(波形耗尽MOS)结构而改善了后栅极偏置效应。在WDMOS结构中,多个沟槽栅极彼此相邻。因此,沟槽门之间的硅容易耗尽,并且可以抑制背栅偏置效果。我们具有WDMOS结构的双向高压PMOSFET的优异特性。

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