High G Testing of MEMS Devices

摘要

Replicating the mechanical environments to which MEMS devices (Micro-Electro-Mechanical Systems) are exposed requires extreme test strategies. Acceleration levels in the 10's of thousands of g's is a normal occurrence in today's MEMS applications. Traditional test methods in use for over a half century are no longer adequate. New test methods are constantly required to meet the demanding quality and reliability levels of everything from emerging consumer applications to safety critical military and automotive systems.