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Reliability of novel die attach adhesive for snap curing

机译:用于快速固化的新型芯片连接胶的可靠性

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Novel adhesive, using in-line process, has been shown to reduceadhesive cure cycle time from 70 minutes to as little as 44 seconds at160° C. Throughput improvement of 60% using existing box ovens and noincrease in floor space has been confirmed on production equipment. Theadhesive is based upon a modified cyanate ester resin, which cures toform a triazine polymer with excellent temperature stability and uniquemoisture properties. It generates 75% less outgassing during cure thantypical snap sure epoxies, which reduces contamination of the chip,leadframe and oven chamber. Live device reliability, equivalent tostandard box oven, has been demonstrated for the new snap cure adhesiveusing in-line cure, as well as, fast box oven process. Material,processing and qualification data is summarized and compared to epoxiesfor analog and logic ICs packaged in SOIC, PDIP, and PLCC body styles.The material has been fully qualified and is in production use
机译:使用在线工艺的新型粘合剂已被证明可以减少 胶粘剂的固化时间从70分钟缩短至44秒 160°C。使用现有的箱式烤箱可将吞吐量提高60%,并且无需 生产设备已确认增加了占地面积。这 粘合剂基于改性的氰酸酯树脂,可固化为 形成具有优异温度稳定性和独特性的三嗪聚合物 水分特性。与固化相比,它产生的脱气量减少了75% 典型的快速环氧树脂,可减少芯片的污染, 引线框和烤箱室。实时设备可靠性,相当于 标准箱式烤箱,已针对新型快速固化胶进行了演示 使用在线固化以及快速箱式烘箱工艺。材料, 总结处理和鉴定数据并将其与环氧树脂进行比较 适用于以SOIC,PDIP和PLCC封装形式封装的模拟和逻辑IC。 该材料已经完全合格,可以在生产中使用

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