首页> 外文会议> >Reliability of novel die attach adhesive for snap curing
【24h】

Reliability of novel die attach adhesive for snap curing

机译:用于快速固化的新型芯片连接胶的可靠性

获取原文

摘要

Novel adhesive, using in-line process, has been shown to reduce adhesive cure cycle time from 70 minutes to as little as 44 seconds at 160/spl deg/C. Throughput improvement of 60% using existing box ovens and no increase in floor space has been confirmed on production equipment. The adhesive is based upon a modified cyanate ester resin, which cures to form a triazine polymer with excellent temperature stability and unique moisture properties. It generates 75% less outgassing during cure than typical snap sure epoxies, which reduces contamination of the chip, leadframe and oven chamber. Live device reliability, equivalent to standard box oven, has been demonstrated for the new snap cure adhesive using in-line cure, as well as, fast box oven process. Material, processing and qualification data is summarized and compared to epoxies for analog and logic ICs packaged in SOIC, PDIP, and PLCC body styles. The material has been fully qualified and is in production use.
机译:已经证明,使用在线工艺的新型胶粘剂在160 / spl deg / C下可以将胶粘剂的固化周期从70分钟减少到44秒。使用现有箱式烤箱的吞吐量提高了60%,生产设备的占地面积没有增加。该粘合剂基于改性的氰酸酯树脂,该树脂固化形成具有出色的温度稳定性和独特的湿气性质的三嗪聚合物。与典型的快速固化环氧树脂相比,它在固化过程中产生的脱气量减少了75%,从而减少了芯片,引线框和炉腔的污染。使用在线固化以及快速的箱式烘箱工艺的新型快速固化粘合剂已经证明了与标准箱式烘箱等效的实时设备可靠性。总结了材料,加工和鉴定数据,并将其与以SOIC,PDIP和PLCC车身样式封装的模拟和逻辑IC的环氧树脂进行比较。该材料已完全合格,可用于生产。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号