Preparation and Characterization of polycrystalline iodized mercury thick films for detector array

摘要

The polycrystalline mercuric iodide thick-film array was deposited by hot wall physical vapor deposition (HWPVD) method using an aluminum alloy mask. The pixel size of the 4×4 array is 5×5 mm~2, and pixel spacing is about 0.2mm. Comparative study of the quality of the films grown on different pixels (type A, B, C) was conducted by Atomic force microscopy (AFM), Scanning electron microscopy (SEM), X-ray diffraction (XRD), and Raman spectroscopy. The results showed that films of all types were all compactly formed by separated columnar monocrystallines with uniform orientation along c-direction and had similar crystalline structures, indicating that the thick films deposited on the substrate had a good uniformity as a whole, and of all the three different type samples, type A were of the relatively highest quality.