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LOW-TEMPERATURE POLYCRYSTALLINE SILICON THIN FILM TRANSISTOR, PREPARATION METHOD THEREFOR, AND ARRAY SUBSTRATE

机译:低温多晶硅硅薄膜晶体管,其制备方法和阵列基质

摘要

A preparation method for a low-temperature polycrystalline silicon thin film transistor, said method comprising: providing a substrate (1), and sequentially forming a buffer layer (2), a low-temperature polycrystalline silicon layer (3), a source contact area (31), a drain contact area (32), a gate insulation layer (4), a gate layer (5) and a dielectric layer (6) on the substrate; forming a first contact hole (71) and a second contact hole (72) which pass through the dielectric layer and the gate insulation layer via dry etching, so as to respectively expose the source contact area and the drain contact area, an etching gas used for the dry etching comprising a fluorine-containing gas and hydrogen gas; on the dielectric layer, forming a source (8) which comes into contact with the source contact area via the first contact hole, and forming a drain (9) which comes into contact with the drain contact area via the second contact hole. H2 is added to the etching gas when preparing the contact holes via the dry etching process, a polycrystalline silicon selection ratio is increased, and polycrystalline silicon loss is very low. Also provided are the low-temperature polycrystalline silicon thin film transistor, and an array substrate.
机译:一种低温多晶硅薄膜晶体管的制备方法,所述方法包括:提供衬底(1),并依次形成缓冲层(2),低温多晶硅层(3),源极接触区(31),衬底上的漏极接触区域(32),栅极绝缘层(4),栅极层(5)和电介质层(6);形成第一接触孔71和第二接触孔72,所述第一接触孔71和第二接触孔72通过干法刻蚀穿过所述介电层和所述栅极绝缘层,以分别暴露所述源极接触区和漏极接触区。用于包含氟气体和氢气的干法蚀刻;在介电层上,形成通过第一接触孔与源极接触区域接触的源极(8),以及通过第二接触孔与漏极接触区域接触的漏极(9)。通过干法刻蚀工艺制备接触孔时,将H 2 添加到刻蚀气体中,提高了多晶硅的选择率,多晶硅的损耗非常低。还提供了低温多晶硅薄膜晶体管和阵列基板。

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