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LOW-TEMPERATURE POLYCRYSTALLINE SILICON THIN FILM TRANSISTOR, PREPARATION METHOD THEREFOR, AND ARRAY SUBSTRATE

机译:低温多晶硅硅薄膜晶体管,其制备方法和阵列基质

摘要

A low-temperature polycrystalline silicon thin film transistor, comprising: a substrate (1); a buffer layer (2), a low-temperature polycrystalline silicon layer (3), a source contact area (31), a drain contact area (32), a gate insulation layer (4), a gate layer (5) and a dielectric layer (6) sequentially arranged on the substrate; a source (7) and a drain (8). The source contact area and the drain contact area are respectively doped with metal ions, the source passes through the dielectric layer to come into contact with the source contact area to form an ohmic contact, and the drain passes through the dielectric layer to come into contact with the drain contact area to form an ohmic contact. The metal ions comprise at least one of Cu2+, Al3+, Mg2+, Zn2+ and Ni2+. Also provided is a preparation method for the low-temperature polycrystalline silicon thin film transistor, wherein an insulating metal oxide layer is arranged, and annealing is performed so that metal ions within the insulating metal oxide layer are doped to a source contact area to be formed and a drain contact area to be formed, so as to form the source and drain contact areas, thereby omitting a P ion implantation process, and significantly simplifying a process flow.
机译:一种低温多晶硅薄膜晶体管,包括:基板(1);缓冲层(2),低温多晶硅层(3),源极接触区(31),漏极接触区(32),栅极绝缘层(4),栅极层(5)和电介质层(6)顺序排列在基板上;源极(7)和漏极(8)。源极接触区和漏极接触区分别掺杂有金属离子,源极穿过介电层与源极接触区接触形成欧姆接触,漏极穿过介电层与接触层接触与漏极接触区域形成欧姆接触。金属离子包含Cu 2 + ,Al 3 + ,Mg 2 + ,Zn 2 + 和Ni 2 + 。还提供了一种低温多晶硅薄膜晶体管的制备方法,其中,布置绝缘金属氧化物层,并进行退火,以使绝缘金属氧化物层内的金属离子掺杂到要形成的源极接触区中。形成要形成的源极和漏极接触区的漏极接触区,从而省略了P离子注入工艺,并大大简化了工艺流程。

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