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Close-Spaced Sublimation Growth and Characterization of Polycrystalline Cd_(1-x)Zn_xTe Thick Films for Flat-Panel X-ray Detectors

机译:平板X射线探测器多晶Cd_(1-x)Zn_xTe厚膜的近距离升华生长和表征

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摘要

Polycrystalline Cd_(1-x)Zn_xTe thick films (x ~ 0.05) with thicknesses above 400 μm were prepared by the close-spaced sublimation (CSS) as a conversion layer for next-generation highly efficient flat-panel X-ray detectors. The effects of the substrate tem
机译:通过近距离升华(CSS)作为下一代高效平板X射线探测器的转换层,制备了厚度大于400μm的多晶Cd_(1-x)Zn_xTe厚膜(x〜0.05)。底物温度的影响

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