首页> 外文会议>12th Annual Pan Pacific Microelectronics Symposium amp; Tabletop Exhibition: International Technical Interchange >WAFER LEVEL PACKAGE USING PRE-APPLIED ANISOTROPIC CONDUCTIVE FILMS (ACFS) FOR FLIP-CHIP ASSEMBLY
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WAFER LEVEL PACKAGE USING PRE-APPLIED ANISOTROPIC CONDUCTIVE FILMS (ACFS) FOR FLIP-CHIP ASSEMBLY

机译:使用预装各向异性导电膜(ACFS)的晶片级封装,用于倒装芯片装配

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摘要

In this study, wafer level flip chip packages using pre- applied ACFs (denoted as ACF-WLPs) were investigated. After ACF pre-lamination on an electroplated Au bumped wafer, and subsequent singulation, and singulated chips were flip-chip assembled on an organic substrate using a thermo-compression bonding method. Au plated bumps were well assembled on Ni/Au pads of organic substrates. The electrical, mechanical properties and the reliabilities of ACF-WLPs were evaluated and compared with conventional ACF flip chip assemblies using thermo- compression method. Contact resistance measurement was performed after under thermal cycling, high temperature/humidity, and pressure cooker test. ACF joints between electroplated Au bumps and substrate metal pads showed stable contact resistance of 5m? per a bump, strong bump adhesion, and similar reliability behaviors compared with conventional ACF flip chip joints using a thermo-compression bonding.
机译:在这项研究中,研究了使用预先应用的ACF(表示为ACF-WLP)的晶圆级倒装芯片封装。在电镀金凸块晶片上进行ACF预层压之后,进行单片化,然后使用热压键合方法将单片芯片倒装芯片组装在有机基板上。镀金的凸块很好地组装在有机基板的Ni / Au焊盘上。对ACF-WLP的电气,机械性能和可靠性进行了评估,并与使用热压缩方法的传统ACF倒装芯片组件进行了比较。在热循环,高温/高湿和高压锅测试之后进行接触电阻测量。电镀金凸块和基底金属焊盘之间的ACF接头显示稳定的接触电阻为5m?与使用热压键合的传统ACF倒装芯片接头相比,每个凸点具有更强的凸点附着力,并且具有相似的可靠性。

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