SEMICONDUCTOR DEVICE, AND VERIFICATION METHOD OF SEMICONDUCTOR TEST DEVICE AND/OR TEST METHOD USING THE SEMICONDUCTOR DEVICE

摘要

PROBLEM TO BE SOLVED: To provide a verification method by which verification of a semiconductor test device and/or semiconductor test method can be performed surely, also to provide a semiconductor device for the verification.;SOLUTION: A defective part is provided intentionally in a spare element of the prescribed part in a spare region of a semiconductor device, a semiconductor test device and/or semiconductor test method are verified by whether the defective part can be tested surely or not. First and second spare regions 2, 4 are provided as a spare of a memory array 8, and a defective part is provided intentionally in a memory cell of the prescribed part in the second spare region 4. Switching between a memory cell in the memory cell array 8 and memory cells in the first and the second spare regions 2, 4 is performed by a control circuit 9. Indication of a switching part is indicated to the control circuit 9 by fusing a desired fuse in an LT fuse group 1 corresponding to the first spare region 2 and an LT fuse group 3 corresponding to the second spare region 4.;COPYRIGHT: (C)2003,JPO