A DESIGN METHOD OF ACCELERATED AGING TESTS FOR SCREENING RELIABLE SEMICONDUCTOR DEVICES USED IN LIFE QUALIFIED EQUIPMENT

摘要

Screening the reliable semiconductor devices by aging testsbecomes a problem if acceleration factors are involved. Adesign method of the temperature accelerated aging tests isproposed. A procedure for the determination of the quantitativeresults of the screening for a succession of test conditions isintroduced.The different acceleration by temperature for differentfailure mechanisms is taken into account. A solution for thesuccesive picking out of the aging test conditions, in order tofind the optimum test conditions, is given. The aging testconditions are represented as a point on the Arrhenius plan.The multitude of points is reduced from a plan to a segment of aline on which the beginning and the direction for successiveattempts are specified. The fulfilment by aged semiconductordevices of the reliability specifications required for their usingin life qualified equipment is assured.A study case points out the necessity and the efficiency ofthe proposed design method.