SEMICONDUCTOR DEVICE TEST SYSTEM, TEST HANDLER, AND TEST HEAD, INTERFACE BLOCK FOR SEMICONDUCTOR DEVICE TESTER, METHOD FOR CLASSIFYING TESTED SEMICONDUCTOR DEVICE AND METHOD FOR SUPPORTING SEMICONDUCTOR DEVICE TEST

摘要

The present invention relates to a semiconductor device test system and a semiconductor device semiconductor test handler, etc. According to the present invention, a temperature controller is provided for eliminating heat generated from a testing board installed at an interface block of a test head, thereby enabling a semiconductor device test to be properly performed.