封面
声明
英文摘要
中文摘要
目录
1Introduction
1.1 Title
1.2 Background of Research
1.3 Motivation
1.4 Technical Specifications
1.5 Thesis Structure
1.6 Summary
2 Semiconductor Technologies
2.1 The era of SiC Material
2.2 Summary
3TI MSP430 RISC MCU
3.1 MSP430F16x Series
3.2 MSP430Fx261x Series
3.3 MSP430C337 Series
3.4 MSP430xG461x Series
3.5 Summary
4Explanation of the measurement method:
4.1Measurement of Semiconductor
4.2 Summary
5 Hardware Design and Software Development
5.1 PCB Design
5.2 Design Schematics
5.3 Software Design and Board Testing
5.4 Programming and Debugging
5.5 Functionality Test
5.6 Summary
6Conclusionand Future Work
致谢
参考文献
Publications