首页> 外国专利> GALLIUM NITRIDE-BASED SEMICONDUCTOR STACKED STRUCTURE, METHOD FOR FABRICATION THEREOF, GALLIUM NITRIDE-BASED SEMICONDUCTOR DEVICE AND LAMP USING THE DEVICE

GALLIUM NITRIDE-BASED SEMICONDUCTOR STACKED STRUCTURE, METHOD FOR FABRICATION THEREOF, GALLIUM NITRIDE-BASED SEMICONDUCTOR DEVICE AND LAMP USING THE DEVICE

机译:基于氮化镓的半导体叠层结构,其制造方法,基于氮化镓的半导体装置以及使用该装置的灯

摘要

A gallium nitride-based semiconductor stacked structure includes a single crystal substrate, a low-temperature buffer layer grown at a low temperature in a region contiguous to the single crystal substrate and a gallium nitride-based semiconductor layer overlying the low-temperature buffer layer. The low-temperature buffer layer possesses therein a single crystal layer formed of a hexagonal A1XGaGN-based Group III nitride material containing gallium predominantly over aluminum, wherein 0.5 G = 1 and X + G = 1. The single crystal layer has crystal defects at a smaller density on a (1.0.-1.0.) crystal face than on a (1.1.-2.0.) crystal face. A method for the production of the gallium nitride-based semiconductor stacked structure includes forming on a single crystal substrate a low-temperature buffer layer grown at a low temperature falling in a range of 250°C to 500°C, forming a gallium nitride-based semiconductor layer on the low-temperature buffer layer and forming in the low-temperature buffer layer a single crystal layer made of a hexagonal AlXGaGN-based Group III nitride material containing gallium predominantly over aluminum, in which 0.5 G =1,X + G = 1, by causing gallium raw material to reach the surface of the substrate before aluminum raw material.
机译:氮化镓基半导体堆叠结构包括:单晶基板;在与单晶基板相邻的区域中在低温下生长的低温缓冲层;以及覆盖在低温缓冲层上的氮化镓基半导体层。低温缓冲层在其中具有单晶层,该单晶层由六方晶系的AlXGaGN基III族氮化物材料形成,该氮化物材料主要包含铝之上的镓,其中0.5

著录项

  • 公开/公告号KR20070086386A

    专利类型

  • 公开/公告日2007-08-27

    原文格式PDF

  • 申请/专利权人 SHOWA DENKO KABUSHIKI KAISHA;

    申请/专利号KR20077013794

  • 发明设计人 UDAGAWA TAKASHI;

    申请日2007-06-18

  • 分类号H01L33/00;

  • 国家 KR

  • 入库时间 2022-08-21 20:33:42

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