首页> 外国专利> SURFACE ETCHING DEVICE FOR SEMICONDUCTOR SUBSTRATE, AND METHOD OF MANUFACTURING SEMICONDUCTOR SUBSTRATE HAVING UNEVEN SHAPE FORMED ON THE SURFACE THEREOF BY USING THE SURFACE ETCHING DEVICE

SURFACE ETCHING DEVICE FOR SEMICONDUCTOR SUBSTRATE, AND METHOD OF MANUFACTURING SEMICONDUCTOR SUBSTRATE HAVING UNEVEN SHAPE FORMED ON THE SURFACE THEREOF BY USING THE SURFACE ETCHING DEVICE

机译:用于半导体基板的表面蚀刻装置,以及通过使用该表面蚀刻装置来制造具有在其表面上形成的不均匀形状的半导体基板的方法

摘要

PROBLEM TO BE SOLVED: To provide a device for etching the surface of a mass-producible semiconductor substrate by using gas of ClF3, XeF2, BrF3 and BrF5.;SOLUTION: A device for etching the surface of a semiconductor substrate comprises a reaction chamber in which the pressure can be reduced to ambient pressure or less, a moving stage which is movable in the reaction chamber and on which a semiconductor substrate is mounted, a nozzle for jetting etching gas containing one or more gas selected from the group consisting of ClF3, XeF2, BrF3 and BrF5, a nozzle for jetting cooling gas containing nitrogen gas or inert gas to the semiconductor substrate, a cleaning chamber in which the pressure can be reduced to ambient pressure or less, a moving stage which is movable in the cleaning chamber and on which the semiconductor substrate is mounted, a nozzle for jetting etching gas containing one or more gas comprising pure water and hydrogen fluoride water to the surface of the semiconductor substrate, and a nozzle for jetting dry gas containing nitrogen gas or inert gas to the semiconductor substrate.;COPYRIGHT: (C)2013,JPO&INPIT
机译:解决的问题:提供一种使用ClF 3 ,XeF 2 ,BrF 3 <的气体蚀刻可批量生产的半导体衬底表面的装置。 / Sub>和BrF 5 .;解决方案:用于蚀刻半导体衬底表面的装置包括一个反应室,在该反应室中压力可以降低到环境压力或更低,移动台是可移动的在反应室中并在其上安装有半导体衬底的喷嘴用于喷射蚀刻气体,该蚀刻气体包含选自ClF 3 ,XeF 2 中的一种或多种气体, BrF 3 和BrF 5 ,用于将含有氮气或惰性气体的冷却气体喷射到半导体基板的喷嘴,该清洗室可以将压力降低到环境压力或以下,在清洁室中可移动并安装有半导体衬底的移动台,用于喷射包含一种或多种气体的蚀刻气体的喷嘴将纯净水和氟化氢水喷到半导体衬底的表面上,并用喷嘴将含有氮气或惰性气体的干燥气体喷到半导体衬底上。版权所有:(C)2013,JPO&INPIT

著录项

  • 公开/公告号JP2013004710A

    专利类型

  • 公开/公告日2013-01-07

    原文格式PDF

  • 申请/专利权人 PANASONIC CORP;

    申请/专利号JP20110133972

  • 申请日2011-06-16

  • 分类号H01L21/302;H01L31/04;

  • 国家 JP

  • 入库时间 2022-08-21 16:58:36

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