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Formation chemistry of high-density nanocraters on the surface of sapphire substrates with an in situ etching and growth mechanism of device-quality GaN films on the etched substrates

机译:蓝宝石衬底表面上高密度纳米坑的形成化学以及被腐蚀衬底上器件质量的GaN膜的原位腐蚀和生长机理

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摘要

An efficient method has been investigated to grow GaN films with sapphire substrates being treated in situ metalorganic chemical vapor deposition reactor for a special effect rather than simple thermal cleaning. First, a thin GaN layer is grown on the sapphire substrate. And then it is almost etched away by thermal decomposition. It is found that the decomposition of GaN induces the decomposition of sapphire resulting in the formation of high-density nanocraters on its surface. Finally the device-quality GaN film is regrown on the etched substrate with residual gallium droplets as nucleation sites. The chemistry of the etching process and the mechanism of the final GaN growth process have been discussed. The distinct feature of this method is the in situ formation of high-density nanocraters on the surface of the substrate. A rough interface between the substrate and GaN can improve the efficiency of the light-emitting diode built on it greatly.
机译:已经研究了一种有效的方法来生长具有蓝宝石衬底的GaN薄膜,该衬底经过原位金属有机化学气相沉积反应器处理,具有特殊效果,而不是简单的热清洗。首先,在蓝宝石衬底上生长GaN薄层。然后几乎被热分解蚀刻掉。发现GaN的分解引起蓝宝石的分解,从而在其表面上形成高密度的纳米坑。最终,器件质量的GaN膜在残留的镓液滴作为成核位点的情况下,在被腐蚀的衬底上重新生长。讨论了蚀刻过程的化学过程和最终GaN生长过程的机理。该方法的显着特征是在基材表面上原位形成高密度纳米坑。衬底和GaN之间的粗糙界面可以大大提高构建在其上的发光二极管的效率。

著录项

  • 来源
    《Applied Physics Letters》 |2004年第20期|p.4041-4043|共3页
  • 作者

    M. Hao; H. Ishikawa; T. Egawa;

  • 作者单位

    Research Center for Nano-Device and System, Nagoya Institute of Technology, Gokiso-cho, Showa-ku, Nagoya 466-8555, Japan;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 应用物理学;
  • 关键词

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