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Low-Temperature Fabrication of Transparent Conductive Contacts for p-GaN and n-GaN

机译:p-GaN和n-GaN的透明导电触点的低温制备

摘要

A ternary transparent conductive oxide, indium zinc oxide (IZO), is formed as a thin film by co-sputtering zinc oxide with indium oxide at a deposition temperature between 25 and 200 C. Optionally, up to 1-2% Al may be added by various methods. The layers may be annealed at temperatures between 200 and 400 C. Measurements of IZO with 75-85 wt % In2O3 showed low resistivity and low visible absorbance, both of which were thermally stable up to 400 C.
机译:三元透明导电氧化物铟锌氧化物(IZO)通过在25到200°C的沉积温度下共溅射氧化锌和氧化铟形成薄膜而形成。可选地,最多可添加1-2%的Al通过各种方法。可以在200至400℃之间的温度下对层进行退火。用75-85 wt%In 2 O 3 进行的IZO测量显示出低电阻率和低可见吸收率,在高达400°C的温度下保持热稳定性

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