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Sintered body target for transparent conductive film fabrication, transparent conductive film fabricated by using the same, and transparent conductive base material comprising this conductive film formed thereon
Sintered body target for transparent conductive film fabrication, transparent conductive film fabricated by using the same, and transparent conductive base material comprising this conductive film formed thereon
A sintered body target for transparent conductive film fabrication is chiefly composed of Ga, In, and O; has a Ga content ranging from 49.1 at. % to 65 at. % with respect to all metallic atoms; is chiefly constructed from a β-GaInO3 phase and an In2O3 phase; provides an In2O3 phase (400)/β-GaInO3 phase (111) X-ray diffraction peak intensity ratio that is 45% or less; and has a density of 5.8 g/cm3 or more. A transparent conductive film obtained by using a sputtering technique is an amorphous oxide transparent conductive film chiefly composed of Ga, In, and O, so that a Ga content ranges from 49.1 at. % to 65 at. % with respect to all metallic atoms, a work function is 5.1 eV or more, and a refractive index for light with a wavelength of 633 nm ranges from 1.65 to 1.85.
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机译:用于透明导电膜制造的烧结体靶主要由Ga,In和O组成;其特征在于,所述靶为Ga。 Ga含量为49.1 at。 %至65 at。相对于所有金属原子的%;主要由β-GaInO 3 Sub>相和In 2 Sub> O 3 Sub>相构成;提供In 2 Sub> O 3 Sub>相(400)/β-GaInO 3 Sub>相(111)的X射线衍射峰强度比为45 % 或更少;密度为5.8 g / cm 3 Sup>或更高。通过溅射技术获得的透明导电膜是主要由Ga,In和O构成的非晶氧化物透明导电膜,因此Ga含量为49.1at。%。 %至65 at。相对于所有金属原子%,功函数为5.1eV或更高,并且对于波长为633nm的光的折射率为1.65至1.85。
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