首页> 外国专利> ACTIVE RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, ACTIVE RAY-SENSITIVE OR RADIATION-SENSITIVE FILM, MASK BLANK HAVING ACTIVE RAY-SENSITIVE OR RADIATION-SENSITIVE FILM, PATTERN FORMING METHOD, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE

ACTIVE RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, ACTIVE RAY-SENSITIVE OR RADIATION-SENSITIVE FILM, MASK BLANK HAVING ACTIVE RAY-SENSITIVE OR RADIATION-SENSITIVE FILM, PATTERN FORMING METHOD, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE

机译:有源射线敏感或辐射敏感的树脂组合物,有源射线敏感或辐射敏感的膜,具有有源射线敏感或辐射敏感的膜的空白,图案形成方法以及制造电子设备的方法

摘要

PROBLEM TO BE SOLVED: To provide an active ray-sensitive or radiation-sensitive resin composition from which a fine pattern with a small space width can be formed with high resolution while suppressing variation in line width of a pattern depending on a PEB temperature, an active ray-sensitive or radiation-sensitive film using the composition, a mask blank including the film, a pattern forming method, a method for manufacturing an electronic device, and an electronic device.SOLUTION: The active ray-sensitive or radiation-sensitive resin composition comprises a resin (A) containing a repeating unit represented by general formula (4), and a crosslinking agent (C) containing a polar group. The crosslinking agent (C) is a compound represented by general formula (1), or a compound in which 2 to 5 structures represented by general formula (1) are connected by a connecting group represented by Lin general formula (3) or by a single bond.SELECTED DRAWING: None
机译:解决的问题:为了提供一种活性射线敏感性或放射敏感性树脂组合物,从其可以以高分辨率形成具有小空间宽度的精细图案,同时抑制取决于PEB温度的图案的线宽变化。使用该组合物的活性射线敏感或辐射敏感膜,包括该膜的掩模坯料,图案形成方法,电子设备的制造方法和电子设备。解决方案:活性射线敏感或辐射敏感树脂组合物包括:树脂(A),其含有通式(4)表示的重复单元;和交联剂(C),其具有极性基团。交联剂(C)是由通式(1)表示的化合物,或由通式(1)表示的2至5个结构通过由Lin通式(3)表示的连接基或由通式(3)表示的化合物连接的化合物。单键选定的图纸:无

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