DEFORMATION MEASUREMENT OF CON-DUCTING POLYTHIOPHENE THIN FILMS BY AN ELECTRONIC SPECKLE PATTERN INTERFEROMETRIC METHOD

摘要

The deformation measurement of electrosynthesized polythiophene(Pth)thin films is difficultbecause of the small thickness and high flexibility of the specimen.An electronic speckle pattern interferom-etry(ESPI)method is used to measure the deformation of Pth films of thicknesses in the range of 4-65 μmTheir stress-strain curves are obtained.It is found that the mechanical properties of Pth films are sensitiveto the specimen thickness.The tensile strength increases with decreasing thickness of thin film from 10 μm.The influence of the electrochemical synthesis conditions on the mechanical properties of Pth films is also dis-cussed.