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A Failure Analysis of SLS Polysilicon TFT Devices for Enhanced Performances

机译：用于增强性能的SLS多晶硅TFT器件的故障分析

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1. Hot-carrier stress induced degradation of SLS ELA polysilicon TFTs - Effects of gate width variation and device orientation [J] . Giannis P. Kontogiannopoulos, Filippos V. Farmakis, Dimitrios N. Kouvatsos, Solid-State Electronics . 2008,第3期

机译：热载流子应力引起的SLS ELA多晶硅TFT退化-栅极宽度变化和器件方向的影响
2. A novel SLS ELA crystallization process and its effects on polysilicon film defectivity and TFT performance [J] . Despina C. Moschou, M.A. Exarchos, D.N. Kouvatsos, Microelectronic Engineering . 2008,第5a6期

机译：SLS ELA的新型结晶工艺及其对多晶硅膜缺陷和TFT性能的影响
3. Performance and reliability of SLS ELA polysilicon TFTs fabricated with novel crystallization techniques [J] . D.C. Moschou, M.A. Exarchos, D.N. Kouvatsos, Microelectronics & Reliability . 2007,第9a11期

机译：用新型结晶技术制造的SLS ELA多晶硅TFT的性能和可靠性
4. Analysis of transport properties of SLS polysilicon TFTs [C] . G.Fortunato, A.Bonfiglietti, A.Valletta, The 6th International Meeting on Information Display and the 5th International Display Manufacturing Conference (IMID/IDMC 2006) . 2006

机译：SLS多晶硅TFT的传输特性分析
5. Design and characterization of polysilicon TFT devices, circuits and systems for large area flexible electronic applications. [D] . Jamshidi-Roudbari, Abbas. 2010

机译：用于大面积柔性电子应用的多晶硅TFT器件，电路和系统的设计和表征。
6. Enhancement of a-IGZO TFT Device Performance Using a Clean Interface Process via Etch-Stopper Nano-layers [O] . Jae-Moon Chung, Xiaokun Zhang, Fei Shang, 2018

机译：通过刻蚀停止层纳米层的清洁界面工艺增强a-IGZO TFT器件的性能
7. Enhancement of a-IGZO TFT Device Performance Using a Clean Interface Process via Etch-Stopper Nano-layers [O] . Jae-Moon Chung, Xiaokun Zhang, Fei Shang, 2018

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A Failure Analysis of SLS Polysilicon TFT Devices for Enhanced Performances

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