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Gate-Controlled P–I–N Junction Switching Device with Graphene Nanoribbon

机译:具有石墨烯纳米孔的栅极控制的P-I-N结装置

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摘要

The concept of a novel graphene P-I-N junction switching device with ananoribbon is proposed, and its basic operation is demonstrated in anexperiment. The concept aims to optimize the operation scheme for graphenetransistors toward a superior on-off property. The device has two bulk grapheneregions where the carrier type is electrostatically controlled by a top gate,and these two regions are separated by a nanoribbon which works as aninsulator. As a result, the device forms a (P or N)-I-(P or N) junctionstructure. The off state is obtained by lifting the band of the bulk grapheneof the source (drain) side and lowering that of the drain (source) side, sothat the device forms a P-I-N (N-I-P) junction. In this configuration, theleakage current can be reduced more effectively than the conventional singlegate transistors with the same band gap size due to a high barrier height and along tunneling length in the nanoribbon. The on state is obtained by flippingthe polarity of the bias of either top gate to form a P-I-P or N-I-N junction.An experiment showed that the drain current was suppressed in the cases ofP-I-N and N-I-P compared to the cases of P-I-P and N-I-N, and all of thebehaviors were consistent with what was expected from the device operationmodel.
机译:提出了一种具有抗an的新颖的石墨烯P-I-n结装置的概念,并且其基本操作在分析中证明。该概念旨在优化瓦片替换机的操作方案,朝向优越的开关物业。该装置具有两个散装格栅,其中载体类型通过顶栅静电控制,并且这两个区域由用作闪算器的纳米孔分开。结果,该装置形成(p或n)-i-(p或n)结结构。通过将源极石墨烯的侧面(漏极)侧的侧面和降低漏极(源)侧的侧面,索塔可以形成P-I-N(N-I-P)结来获得OFF状态。在这种配置中,由于高屏障高度并且沿纳米孔中的隧道长度,可以比传统的垂直晶体管更有效地减小了所谓的电流。通过将任一顶栅极的偏差的极性翻转以形成PIP或NIN结来获得的ON状态。实验表明,与PIP和NIN的情况相比,在PIEN和NIN的情况下抑制了漏极电流。所有的TheBehaviors都与设备操作从设备的预期符合。

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