首页> 美国政府科技报告 >Low-Temperature Microwave Characteristics of 0.l microns Gate-LengthPseudomorphic In(0.52)Al(0.48) As/In(x)Ga(1-x)As (x = 0.85 and 0.95) MODFET's
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Low-Temperature Microwave Characteristics of 0.l microns Gate-LengthPseudomorphic In(0.52)Al(0.48) As/In(x)Ga(1-x)As (x = 0.85 and 0.95) MODFET's

机译:低温微波特性0.1微米栅长度假形In(0.52)al(0.48)as / In(x)Ga(1-x)as(x = 0.85和0.95)mODFET

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摘要

Transmit/receive modules for space communication systems based on microwavemonolithic integrated circuit (MMIC) technology require high performance devices at cryogenic temperatures. Due to their temperature-dependent performance, the low temperature characteristics of FET' s must be measured for circuit design. A cryogenically-cooled FET amplifier has been demonstrated at 32 GHz and an associated gain of 26 dB was measured at 39 K. Moreover, low temperature characterization of GaAs-based MODFET's. MISFET's and MESFET's have been reported. jg p.2.

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