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Maximum drift velocity of electrons in selectively doped InAlAs/InGaAs/InAlAs heterostructures with InAs inserts

机译:具有InAs插入物的选择性掺杂InAlAs / InGaAs / InAlAs异质结构中电子的最大漂移速度

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摘要

The dependence of the electron mobility and drift velocity on the growth conditions, thickness, and doping of an InAs insert placed at the center of the quantum well in a selectively doped InAlAs/InGaAs/InAlAs heterostructure has been investigated. Record enhancement of the maximum drift velocity to (2-4) × 10~7 cm/s in an electric field of 5 × 10~3 V/cm has been obtained in a 17-nm-wide quantum well with an undoped 4-nm-thick InAs insert. In the structures with additional doping of the InAs insert, which facilitates an increase in the density of electrons in the quantum well to 4. 0 × 10~(12) cm~(-2), the maximum drift velocity is as high as 2 × 10~7 cm/s in an electric field of 7 × 10~3 V/cm.
机译:已经研究了电子迁移率和漂移速度对选择性掺杂的InAlAs / InGaAs / InAlAs异质结构中位于量子阱中心的InAs插入物的生长条件,厚度和掺杂的依赖性。在未掺杂4-的17 nm宽量子阱中,在5×10〜3 V / cm的电场中,最大漂移速度提高到(2-4)×10〜7 cm / s的记录增强。 nm厚的InAs插入件。在具有InAs插入物的额外掺杂的结构中,这有助于将量子阱中的电子密度提高到4。0×10〜(12)cm〜(-2),最大漂移速度高达2在7×10〜3 V / cm的电场中×10〜7 cm / s。

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