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Mechanisms of the degradation of Schottky-barrier photodiodes based on ZnS single crystals

机译:基于ZnS单晶的肖特基势垒光电二极管的退化机理

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The effect of ultraviolet (UV) illumination on the electrical and spectral characteristics of Schottky-barrier photodiodes based on ZnS single crystals is studied. It is found that irradiation deteriorates their photosensitivity and changes the current-voltage and capacitance-voltage characteristics and the surface profile of the blocking electrode. It is shown that the main reason for a decrease in the photosensitivity of the diodes is the photoinduced drift of mobile donors in the electric field of the barrier. This drift depends on the crystallographic orientation of the surface being irradiated. Another photoinduced process observed in the diodes is photolysis of the ZnS crystal. This process mainly determines the change in the electrical characteristics of the diodes and in the surface profile of the electrode at an insignificant change in the photosensitivity.
机译:研究了紫外线照射对基于ZnS单晶的肖特基势垒光电二极管的电学和光谱特性的影响。发现辐射使它们的光敏性变差并且改变了电流-电压和电容-电压特性以及阻挡电极的表面轮廓。已经表明,降低二极管的光敏性的主要原因是在阻挡层电场中光可移动的施主漂移。该漂移取决于被照射表面的晶体学取向。在二极管中观察到的另一种光诱导过程是ZnS晶体的光解。该过程主要确定二极管的电特性的变化以及光敏度的不明显变化时电极的表面轮廓的变化。

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