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Magnetotransport and conductivity mechanisms in Cu2ZnSnxGe1−xS4 single crystals

机译:Cu2ZnSnxGe1-xS4单晶的磁输运和电导机理

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摘要

Resistivity, ρ(T), and magnetoresistance (MR) are investigated in the Cu2ZnSnxGe1−xS4 single crystals, obtained by the chemical vapor transport method, between x = 0–0.70, in the temperature range of T ~ 50–300 K in pulsed magnetic field of B up to 20 T. The Mott variable-range hopping (VRH) conductivity is observed within broad temperature intervals, lying inside that of T ~ 80–180 K for different x. The nearest-neighbor hopping conductivity and the charge transfer, connected to activation of holes into the delocalized states of the acceptor band, are identified above and below the Mott VRH conduction domain, respectively. The microscopic electronic parameters, including width of the acceptor band, the localization radius and the density of the localized states at the Fermi level, as well as the acceptor concentration and the critical concentration of the metal-insulator transition, are obtained with the analysis of the ρ(T) and MR data. All the parameters above exhibit extremums near x = 0.13, which are attributable mainly to the transition from the stannite crystal structure at x = 0 to the kesterite-like structure near x = 0.13. The detailed analysis of the activation energy in the low-temperature interval permitted estimations of contributions from different crystal phases of the border compounds into the alloy structure at different compositions.
机译:在T〜50–300 K的脉冲温度范围内,通过化学气相传输方法获得的Cu2ZnSnxGe1-xS4单晶中的电阻率ρ(T)和磁阻(MR)处于x = 0-0.70之间在高达20 BT的B磁场下,在较宽的温度区间内观察到Mott变程跳变(VRH)电导率,对于不同的x,它位于T〜80–180 K的电导率范围内。在Mott VRH传导域的上方和下方分别确定了与将空穴激活到受体带的离域状态有关的最邻近跃迁电导率和电荷转移。微观电子参数,包括受体带的宽度,费米能级的局域半径和局域态密度以及金属-绝缘体跃迁的受体浓度和临界浓度,通过分析ρ(T)和MR数据。上述所有参数在x = 0.13附近表现出极值,这主要归因于从x = 0的锡矿晶体结构到x = 0.13附近的硅藻土结构的转变。在低温区间对活化能进行详细分析,可以估算出在不同组成下边界化合物的不同晶相对合金结构的贡献。

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