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Release of Epitaxial Layers Grown on InAs Substrates

机译:在InAs衬底上生长的外延层的释放

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摘要

We present a process for selectively releasing large area epitaxial layers from InAs substrates. The technique employs the extreme selectivity between InAs and GaSb when etched by hydrochloric acid. The etch-stop layer is a strain-compensated superlattice containing GaSb. It is sandwiched between the desired epitaxial layer and the InAs substrate to effectively stop the etch process, leaving the desired epitaxial layer with high surface and crystal quality after the process. The etch-stop layer can be further etched away. The epitaxial thin film had been successfully grafted to a GaAs substrate by van tier Waals bonding.
机译:我们提出了一种从InAs衬底上选择性释放大面积外延层的工艺。该技术利用盐酸蚀刻时,在InAs和GaSb之间具有极高的选择性。蚀刻停止层是包含GaSb的应变补偿超晶格。它将其夹在所需的外延层和InAs衬底之间,以有效地停止蚀刻过程,从而在处理后留下具有高表面和晶体质量的所需外延层。蚀刻停止层可以被进一步蚀刻掉。外延薄膜已经通过范蒂尔·瓦尔斯键合成功地嫁接到了GaAs衬底上。

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