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Improved RF and DC performance in AlGaN/GaN HEMT by P-type doping in GaN buffer for millimetre-wave applications

机译:通过针对毫米波应用的GaN缓冲器的P型掺杂,改善了AlGaN / GaN Hemt中的RF和DC性能

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In this paper, the RF and DC performance of AlGaN/GaN HEMT having p-type doping in GaN buffer layer was analysed. Novelty of this work lies in the inclusion of P-type doping in GaN buffer of proposed GaN-HEMT. The result shows the significance of p-type doping at GaN buffer layer for enhancing the RF characteristics of the AlGaN/GaN HEMT. The use of p-type doping in GaN buffer layer increase the conduction band minima in the channel and thereby improving the transconductance of the device. The proposed HEMT achieves a peak transconductance of 330 mS/mm at V-Gs = -2 V and a maximum drain current of 850 mA/mm. The unity-gain cut-off frequency, small signal capacitance and conductance were also extracted to demonstrate its influence on RF performance. The proposed GaN HEMT has exhibited a unity current gain cut-off frequency of 45 GHz, which is 40% higher than that of conventional HEMT. The improved RF and DC performance of proposed HEMT makes it suitable for millimetre-wave applications. (C) 2019 Elsevier GmbH. All rights reserved.
机译:在本文中,分析了GaN缓冲层中具有p型掺杂的AlGaN / GaN HEMT的RF和DC性能。这项工作的新奇是在提出的GaN-HEMT的GaN缓冲液中包含p型掺杂。结果表明,P型掺杂在GaN缓冲层中的意义,用于增强AlGaN / GaN HEMT的RF特性。在GaN缓冲层中使用p型掺杂增加了通道中的导通带最小值,从而提高了装置的跨导。所提出的HEMT在V-GS = -2V下实现330ms / mm的峰跨导,以及850mA / mm的最大漏极电流。还提取了单位增益截止频率,小信号电容和电导,以展示其对RF性能的影响。所提出的GaN HEMT已经表现出45 GHz的统一电流增益截止频率,比传统HEMT高40%。所提出的HEMT的改进的RF和DC性能使其适用于毫米波应用。 (c)2019年Elsevier GmbH。版权所有。

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