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Transparent bipolar resistive switching memory on a flexible substrate with indium-zinc-oxide electrodes

机译:具有铟锌氧化物电极的柔性基板上的透明双极电阻式开关存储器

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We fabricated transparent indium zinc oxide (IZO)/TiO2/IZO devices on flexible polyethylene phthalate (PET) substrates. These devices demonstrate bipolar resistive switching behavior, exhibit a transmittance greater than 80 % for visible light, and have stable resistive switching properties, including long retention and good endurance. In addition, the devices were investigated based on their temperature dependence; the results show metallic properties in the low-resistance state (LRS) and semiconducting properties in the high-resistance state (HRS). The conduction mechanism for resistive switching in our device was well-fitted with Ohmic conduction in the LRS and Poole-Frenkel emission in the HRS. The mechanism could be explained by the formation and the rupture of the conduction paths formed by the movement of oxygen ions and vacancies. Moreover, acute bending of the devices did not affect the memory characteristics because of the pliability of both the IZO electrodes and the thin oxide layer. These results indicate potential applications as resistive random access memories in future flexible, transparent electronic devices.
机译:我们在柔性聚邻苯二甲酸乙二醇酯(PET)基板上制造了透明的氧化铟锌(IZO)/ TiO2 / IZO器件。这些器件表现出双极电阻切换性能,对可见光具有大于80%的透射率,并且具有稳定的电阻切换特性,包括较长的保持时间和良好的耐久性。此外,还根据温度对设备进行了研究。结果显示低电阻状态(LRS)的金属性能和高电阻状态(HRS)的半导体性能。我们设备中电阻切换的传导机制与LRS的欧姆传导和HRS的Poole-Frenkel发射非常吻合。该机理可以通过由氧离子和空位的运动形成的传导路径的形成和破裂来解释。此外,由于IZO电极和薄氧化层的柔韧性,器件的急剧弯曲不会影响存储特性。这些结果表明在未来的灵活,透明的电子设备中作为电阻性随机存取存储器的潜在应用。

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