首页> 外文期刊>Journal of the Korean Physical Society >Quantum-well Intermixing Process for Large Blueshifting in an Ion-implanted InGaAs/InGaAsP Multiple-quantum-well Structure Using Two-step Annealing
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Quantum-well Intermixing Process for Large Blueshifting in an Ion-implanted InGaAs/InGaAsP Multiple-quantum-well Structure Using Two-step Annealing

机译:采用两步退火的离子注入InGaAs / InGaAsP多量子阱结构中大蓝移的量子阱混合过程

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摘要

We describe studies on implantation-enhanced quantum-well intermixing in a lattice-matched InGaAs/InGaAsP multiple-quantum-well p-i-n heterostructure. Samples are implanted with a dose of 5 × 10~(14) P~+ ions /cm~2 at a high energy of 1 MeV. The band gaps in the samples are determined from the photoluminescence at room temperature. The Rapid Thermal Annealing (RTA) process is carried out at 675 °C for 9 minutes, and the blue-shift of the band gap is as large as 107 nm. However, the band shift is improved to 140 um when a novel two-step annealing process is conducted at 675 °C (9 min) and at 875 °C (1 min) in sequence.
机译:我们描述了在晶格匹配的InGaAs / InGaAsP多量子阱p-i-n异质结构中注入增强量子阱混合的研究。以1 MeV的高能量注入5×10〜(14)P〜+离子/ cm〜2的样品。由室温下的光致发光确定样品中的带隙。快速热退火(RTA)工艺在675°C下进行9分钟,带隙的蓝移最大为107 nm。但是,当依次在675°C(9分钟)和875°C(1分钟)进行新颖的两步退火工艺时,带隙可提高到140 um。

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