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Quantum well intermixing in InGaAsP structures induced by low temperature grown InP

机译:低温生长的InP诱导的InGaAsP结构中的量子阱混合

摘要

A quantum well structure having an indium gallium arsenide phosphide (InGaAsP) quantum well active region has a low temperature grown indium phosphide (LT-InP) cap layer grown on it. Defects in the cap layer are intermixed into the quantum well active region by rapid thermal annealing to produce a blue shift in the active region. The blue shift increases as the growth temperature of the LT-InP cap layer decreases or as the phosphine flow rate during production of the LT-InP layer increases.
机译:具有砷化铟镓磷化物(InGaAsP)量子阱有源区的量子阱结构具有在其上生长的低温生长的磷化铟(LT-InP)盖层。通过快速热退火将盖层中的缺陷混合到量子阱有源区中,以在有源区中产生蓝移。蓝移随着LT-InP盖层的生长温度降低或随着LT-InP层生产过程中磷化氢流速的增加而增加。

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