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Thermal impedance of multi-finger microelectronic structures: exact analytical model

机译:多指微电子结构的热阻抗:精确分析模型

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摘要

An exact analytical expression for the complex thermal impedance Z of multi-finger microelectronic components is presented in this paper. The integral transform technique has been used to obtain this expression and solve the three dimensional heat conduction equation directly in the frequency domain. Calculations were first performed for a single-finger on a single-layer structure in order to compare the results with those available in the literature and hence validate the solution. Generally, the comparison shows good agreement between our results and those given in most publications. When the structures are composed of several layers, the thermal impedance changes with the thermal conductivities and the thicknesses of the different layers. It is also affected by the thermal contact resistance between the layers. Some results illustrate the influence of these parameters. The case of a multi-finger component is then treated and the influence of distances between fingers is investigated. For all cases, the Nyquist diagram (i.e. Im(Z) versus Re(Z) for different pulsation values.) is plotted. Mainly two zones are observed: one for the high frequencies and the other for the lower ones. The substrate dimensions are found to largely influence the scale of the low frequency zone whereas the distance between the fingers influences the higher one. Finally, the solution is applied to a multi-finger device in contact with a heat sink.
机译:本文给出了多指微电子元件复数热阻Z的精确解析表达式。已经使用积分变换技术来获得该表达式并直接在频域中求解三维热传导方程。首先在单层结构上针对单指进行计算,以便将结果与文献中提供的结果进行比较,从而验证解决方案。一般而言,比较表明我们的结果与大多数出版物中给出的结果吻合良好。当结构由多层组成时,热阻随导热率和不同层的厚度而变化。层之间的热接触电阻也会影响它。一些结果说明了这些参数的影响。然后处理多指组件的情况,并研究指间距离的影响。对于所有情况,都绘制了奈奎斯特图(即不同脉动值的Im(Z)与Re(Z))。主要观察到两个区域:一个用于高频,另一个用于低频。发现衬底的尺寸在很大程度上影响低频区域的规模,而指之间的距离影响较高的区域。最后,将该解决方案应用于与散热片接触的多指设备。

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