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首页> 外文期刊>Journal of electroceramics >Determination of optical band gap of ZnO:ZnAl_2O_4 composite semiconductor nanopowder materials by optical reflectance method
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Determination of optical band gap of ZnO:ZnAl_2O_4 composite semiconductor nanopowder materials by optical reflectance method

机译:光学反射法测定ZnO:ZnAl_2O_4复合半导体纳米粉体材料的带隙

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摘要

ZnO:ZnAl_2O_4 composite semiconductor nanopowder materials were synthesized by sol gel method. X-ray diffraction results reveal that Al doped ZnO samples have a polycrystalline hexagonal structure with a=3.2506 A, c=5.2079 A lattice parameters. The crystallite size of the ZnO samples is decreased with increasing Al content. Atomic force microscope results indicate the presence of microanohexagons with different sizes from 128 to 166 nm. Optical band gap of the ZnO samples is decreased and reaches a low value of 2.82 eV for 20% Al. The electrical conductivity dependence of temperature confirms that ZnO:ZnAl_2O_4 composite semiconductor nanopowder materials exhibit semiconductor behavior.
机译:采用溶胶凝胶法合成了ZnO:ZnAl_2O_4复合半导体纳米粉体材料。 X射线衍射结果表明,掺杂Al的ZnO样品具有a = 3.2506 A,c = 5.2079 A的晶格参数的多晶六边形结构。 ZnO样品的微晶尺寸随Al含量的增加而减小。原子力显微镜结果表明存在大小为128至166 nm的微米/纳米六边形。 ZnO样品的光学带隙减小,并且对于20%Al达到2.82 eV的低值。温度的电导率依赖性证实了ZnO:ZnAl_2O_4复合半导体纳米粉体材料具有半导体性能。

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