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Comparison Study of Tunneling Models for Schottky Field Effect Transistors and the Effect of Schottky Barrier Lowering

机译:肖特基场效应晶体管隧穿模型与肖特基势垒降低效应的比较研究

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An Airy function transfer matrix tunneling model and the Wentzel-Kramers-Brillouin (WKB) tunneling model have been compared in the application to Schottky field effect transistors (SFETs) with and without the incorporation of Schottky barrier lowering (SBL). Model calculations have shown that the WKB model can predict tunneling current through a Schottky barrier with reasonable accuracy when SBL is excluded. It is also shown that the WKB model can mimic the total current behavior in an SFET when SBL is included and when thermal current is excluded. In both cases, though, the actual physical behavior of the SFET is misrepresented, and so it is finally shown that in the design cases of interest (low Schottky barrier heights), thermal current dominates the total ON-state current in SFETs.
机译:在应用肖特基势垒晶体管(SFET)的情况下,已将艾里函数传递矩阵隧穿模型和Wentzel-Kramers-Brillouin(WKB)隧穿模型进行了比较,无论是否结合了肖特基势垒降低(SBL)。模型计算表明,当排除SBL时,WKB模型可以以合理的精度预测通过肖特基势垒的隧道电流。还显示出,当包含SBL且不包括热电流时,WKB模型可以模拟SFET中的总电流行为。但是,在这两种情况下,SFET的实际物理行为均被错误描述,因此最终表明,在感兴趣的设计案例(低肖特基势垒高度)中,热电流主导着SFET的总导通状态电流。

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