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A Generalized Threshold Voltage Model of Tied and Untied Double-Gate Junctionless FETs for a Symmetric and Asymmetric Structure

机译:对称和非对称结构的绑扎和非绑扎双门无结FET的通用阈值电压模型

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摘要

A general potential model is proposed for all types of double-gate junctionless FETs (DGJL-FETs), i.e., the symmetric versus asymmetric DG structures and the tied versus untied DG structures. The potential model is obtained with a simple form through a 2-D Poisson’s equation based on the assumption that the vertical channel potential is approximated to a cubic function of the position in order to consider all types of DGJL-FETs. An analytical threshold voltage ( equation via the potential model is derived with the gate voltage when the sum of the depletion widths from the front-gate and the back-gate equals the body thickness. The analytic solution of shows good agreement with the simulation results down to a channel length <20 nm. The variability of is analyzed for various device parameters. The back-gate effect of the untied DG structure is also investigated.
机译:针对所有类型的双栅极无结FET(DGJL-FET)提出了一种通用的电势模型,即对称与不对称DG结构以及束缚与非束缚DG结构。电位模型是通过二维Poisson方程以简单形式获得的,该假设基于以下假设:垂直通道电势近似于位置的三次函数,以便考虑所有类型的DGJL-FET。当来自前栅极和后栅极的耗尽宽度之和等于体厚时,利用栅极电压推导出一个解析阈值电压(通过电势模型的方程。)的解析解与模拟结果吻合良好,向下在小于20 nm的通道长度上,分析了各种器件参数的可变性,还研究了无固定DG结构的背栅效应。

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