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A Precision CMOS Voltage Reference Exploiting Silicon Bandgap Narrowing Effect

机译:利用硅带隙变窄效应的精密CMOS电压基准

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摘要

A compact voltage-mode bandgap voltage reference (BGR) is presented. Instead of using overhead circuits, the silicon bandgap narrowing effect is exploited for bipolar junction transistor’s (BJT) curvature reduction and residual curvature correction. Prototype measurements in a 0.18- standard CMOS process show that the curvature of the BJT is effectively reduced from its inherent 3.6 mV to 1.4 mV. The proposed BGR measures a minimum temperature coefficient of 8.7 ppm/ °C from −55 °C to 125 °C by batch trimming one resistor. After a curvature trimming, it further improves to 4.1 ppm/ °C. The BGR has a minimum supply voltage of 1.3 V, 4.3 nominal current consumption, 0.03%/V line sensitivity, and 2 mV/mA load sensitivity at 25 °. The output rms noise in the -Hz band measures 10.23 .
机译:提出了一种紧凑的电压模式带隙基准电压源(BGR)。硅带隙变窄效应被用于双极结晶体管(BJT)的曲率减小和残余曲率校正,而不是使用开销电路。在0.18-标准CMOS工艺中进行的原型测量表明,BJT的曲率从其固有的3.6 mV有效降低到1.4 mV。拟议的BGR通过批量修整一个电阻器,可在−55°C至125°C范围内测得的最小温度系数为8.7 ppm /°C。修整曲率后,它会进一步提高到4.1 ppm /°C。 BGR的最小电源电压为1.3 V,标称电流消耗为4.3,线路灵敏度为0.03%/ V,25°C时的负载灵敏度为2 mV / mA。 -Hz频带中的输出均方根噪声为10.23。

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