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X-ray absorption spectroscopy and x-ray magnetic circular dichroism of epitaxially grown Heusler alloy Co_2MnSi ultrathin films facing a MgO barrier

机译:外延生长的面向MgO阻挡层的Heusler合金Co_2MnSi超薄膜的X射线吸收光谱和X射线磁性圆二色性

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摘要

We element specifically studied the electronic and magnetic states of epitaxially grown full-Heusler alloy Co_2MnSi (CMS) 1.1 nm (4 ML) thick ultrathin films facing an epitaxial MgO(001) tunnel barrier by means of x-ray absorption spectroscopy (XAS) and x-ray magnetic circular dichroism (XMCD). In situ reflection high-energy electron-diffraction observations indicated that the CMS films grew into the L2_1 structure. The observed XAS and XMCD spectra revealed that the CMS ultrathin film was not oxidized. The ratio of Mn and Co spin magnetic moments obtained by applying the sum rules was about 2.7, close to a theoretical value of 2.8 for CMS with the L2_1 structure.
机译:我们通过x射线吸收光谱(XAS)和X射线衍射(XAS)专门研究了外延生长的全Heusler合金Co_2MnSi(CMS)1.1 nm(4 ML)厚的面对外延MgO(001)隧道势垒的超薄膜的电子和磁态。 X射线磁性圆二色性(XMCD)。原位反射高能电子衍射观察表明,CMS薄膜生长为L2_1结构。观察到的XAS和XMCD光谱表明CMS超薄膜没有被氧化。通过应用和规则获得的Mn和Co自旋磁矩之比约为2.7,接近具有L2_1结构的CMS的理论值2.8。

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